By C. Cameron Miller, NIST, Yuqin Zong, NIST, and Jeff Hulett, Vektrex
Vektrex CTO Jeff Hulett and NIST scientists Cameron Miller and Yuqin Zong co-authored an article on new optical metrology standards for UV devices. The article discusses the importance of documentary standards in the modern economy, particularly at inflection points, such as the introduction of new technology (e.g. UV-C LEDs). It then outlines the new UV measurement standards that have recently been published. Several new standards that are planned are outlined and explained. Finally, the three speculate on the possibility of additional application-specific standards for specific UV markets.
