Accurate Optical Measurements of Light Emitting Diodes and Laser Diodes using the powerful Differential Continuous Pulse measurement method.

The powerful Differential Continuous Pulse (DCP) measurement method and an improved Mean-DCP method are formally presented to the scientific and metrology community in a paper written by Jeff Hulett along with Cameron Miller, and Yuqin Zong of NIST. Additional co-authors include Nomasa Koide and Yoshiki Yamaji, of Nichia Corporation. Yamaji and Koide originated the DCP method, which remained secret for many years, before it was disclosed during a September, 2020 CIE standards meeting. Vektrex short pulse SMU was used to research and prove the recommended measurement method. This paper appears in volume 126 of NIST’s Journal of Research:

Special Section on Ultraviolet Technologies for Public Health

https://www.nist.gov/nist-research-library/journal-research-nist

Email info@vektrex.com to learn more about accurate optical measurements.

About Jeff Hulett

Jeff Hulett is the Founder and CTO of Vektrex Electronic Systems, Inc. Because of his vision and leadership, the company grew from a start-up to the market leader. Currently, Hulett is the Chief Architect for Vektrex products placing the highest emphasis on technology and quality. Hulett holds a BSEE from the Illinois Institute of Electronics, and has been awarded four U.S.patents. He is a member of the Illumination Engineering Society of North America (IESNA), and chairs the IESNA LM-80 working group that is focused on LED flux maintenance testing. He has been active in the LED testing and reliability field since 2004.

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