CORM November 12, 2024
This paper presents a UV-LED characterization system that automates both electrical and optical measurements. The system is highly flexible, supporting long-pulse measurement methods (e.g., 20 ms pulses) and newer short-pulse techniques, which are typically 100 times more accurate.
Measurement flexibility is a critical issue as the LED industry transitions from traditional long-pulse measurements, which involve significant device heating, to short-pulse measurements that minimize heating
The presented UV-LED characterization system supports both legacy and modern measurement techniques. It features a novel compact spectroradiometer with a back-thinned, TEC-cooled detector and an integrated photodiode. A short-pulse pulsed Source/Measure Unit (SMU) drives the LED.
The system software implements several widely-use measurement methods, including the powerful Differential Continuous Pulse (DCP) measurement method described in ANSI/IES LM-92 and LM-85.
This presentation outlines the system architecture, highlights its key features, and presents actual commercial LED test results.
Learn more about the UV-LED Characterization test system
