Designed specifically to control and test current driven semiconductor devices, the Burn-In Test System is configurable with any SpikeSafe DC, Continuous Pulse or Performance series multichannel current source. These multichannel current sources offer multiple individually controllable source channels. With a wide range of currents and voltages available, system configurations and usage is simplified. SpikeSafe-ness patented transient protection rapidly shuts down power to devices, within ns, when an anomaly is detected. These digitally controlled provide a flexible, scalable foundation that meet stringent burn-in test protocols.
Burn-In Test System Features
- Reliable precise current with MTBF of 175,000 hours
- Easy to use software application
- Duration Timers – accurate test duration timers to automatically stop test at completion or pause test and restart.
- Failsafe Temperature Monitoring and Shutdown – Protect devices from thermal runaway conditions and over/under temperature
- Individually controllable source channels
- Operating modes DC/CW and pulsed modes
- Slow ramp up and no reverse bias
Burn-In Software Application – STARS
STARS (SpikeSafe Test and Reliability System) is a complete turnkey software application that provides all burn-in functions and access to all operating modes.
- Duration Timers
- Recipes to save and reuse configurations
- User defined location definitions
- User defined datalog file locations
- Available at no charge with the LED Burn-in Test Station